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Information card for entry 4078355
Preview
| Coordinates | 4078355.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H54 Cl2 P3 Rh Sn |
|---|---|
| Calculated formula | C44 H54 Cl2 P3 Rh Sn |
| SMILES | ClCCl.[Rh]([Sn](c1ccccc1)(c1ccccc1)c1ccccc1)(C#Cc1ccccc1)([P](C)(C)C)([P](C)(C)C)([P](C)(C)C)C#Cc1ccccc1 |
| Title of publication | Five- and Six-Coordinate Bis(alkynyl)rhodium(III) Complexes Containing a Rh−SnPh3Bond |
| Authors of publication | Werner, Helmut; Gevert, Olaf; Haquette, Pierre |
| Journal of publication | Organometallics |
| Year of publication | 1997 |
| Journal volume | 16 |
| Journal issue | 4 |
| Pages of publication | 803 |
| a | 9.783 ± 0.003 Å |
| b | 19.22 ± 0.006 Å |
| c | 24.25 ± 0.08 Å |
| α | 90° |
| β | 98.5 ± 0.2° |
| γ | 90° |
| Cell volume | 4510 ± 15 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0349 |
| Residual factor for significantly intense reflections | 0.029 |
| Weighted residual factors for all reflections | 0.0788 |
| Weighted residual factors for significantly intense reflections | 0.0725 |
| Goodness-of-fit parameter for all reflections | 1.078 |
| Goodness-of-fit parameter for significantly intense reflections | 1.07 |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4078355.html
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