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Information card for entry 4078403
Preview
Coordinates | 4078403.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H50 N4 Nb2 O |
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Calculated formula | C52 H50 N4 Nb2 O |
SMILES | [Nb]1(N([c]23[cH]4[Nb]56789%10%11%122([cH]4[cH]5[cH]6[cH]37)[cH]2[cH]8[cH]9[cH]%10[cH]%11[c]%122N1c1ccccc1)c1ccccc1)(N(c1ccccc1)c1ccccc1)N(c1ccccc1)c1ccccc1.O(CC)CC |
Title of publication | Molecular Rearrangements of a Low-Valent Niobium Amide: Ligand C−H Bond Oxidative Addition and Reductive Elimination |
Authors of publication | Tayebani, Maryam; Feghali, Khalil; Gambarotta, Sandro; Yap, Glenn |
Journal of publication | Organometallics |
Year of publication | 1998 |
Journal volume | 17 |
Journal issue | 19 |
Pages of publication | 4282 |
a | 14.1827 ± 0.0007 Å |
b | 15.5713 ± 0.0008 Å |
c | 19.2238 ± 0.0009 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4245.4 ± 0.4 Å3 |
Cell temperature | 183 ± 2 K |
Ambient diffraction temperature | 183 ± 2 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0219 |
Residual factor for significantly intense reflections | 0.0211 |
Weighted residual factors for all reflections | 0.0572 |
Weighted residual factors for significantly intense reflections | 0.056 |
Goodness-of-fit parameter for all reflections | 1.008 |
Goodness-of-fit parameter for significantly intense reflections | 1.001 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4078403.html
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Users of the data should acknowledge the original authors of the
structural data.