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Information card for entry 4078872
Preview
Coordinates | 4078872.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C70 H55 Al N4 O2 Si2 |
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Calculated formula | C70 H55 Al N4 O2 Si2 |
SMILES | [Al]1234(Oc5c(C=[N]2c2cccc6ccc[n]1c26)cc(C)cc5[Si](c1ccccc1)(c1ccccc1)c1ccccc1)Oc1c(CN4c2cccc4ccc[n]3c24)cc(C)cc1[Si](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Meerwein‒Ponndorf‒Verley-Type Reduction Processes in Aluminum and Indium Isopropoxide Complexes of Imino-Phenolate Ligands |
Authors of publication | Normand, Mickael; Kirillov, Evgeny; Roisnel, Thierry; Carpentier, Jean-François |
Journal of publication | Organometallics |
Year of publication | 2012 |
Journal volume | 31 |
Journal issue | 15 |
Pages of publication | 5511 |
a | 11.4874 ± 0.0005 Å |
b | 14.5877 ± 0.0006 Å |
c | 20.6198 ± 0.001 Å |
α | 110.077 ± 0.002° |
β | 93.425 ± 0.002° |
γ | 107.986 ± 0.002° |
Cell volume | 3033.2 ± 0.2 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0704 |
Residual factor for significantly intense reflections | 0.0508 |
Weighted residual factors for significantly intense reflections | 0.1392 |
Weighted residual factors for all reflections included in the refinement | 0.1497 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4078872.html
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Users of the data should acknowledge the original authors of the
structural data.