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Information card for entry 4079570
Preview
| Coordinates | 4079570.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H43 Cr N2 O3 S |
|---|---|
| Calculated formula | C36 H43 Cr N2 O3 S |
| SMILES | CC1=CC(C)=[N](c2ccc(cc2)C)[Cr]2345([cH]6[cH]5[cH]4[cH]3[cH]26)(N1c1c(cccc1C(C)C)C(C)C)OS(=O)(=O)c1ccc(cc1)C |
| Title of publication | Controlling Secondary Alkyl Radicals: Ligand Effects in Chromium-Catalyzed C‒P Bond Formation |
| Authors of publication | Zhou, Wen; MacLeod, K. Cory; Patrick, Brian O.; Smith, Kevin M. |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 21 |
| Pages of publication | 7324 |
| a | 10.9124 ± 0.0013 Å |
| b | 11.399 ± 0.0012 Å |
| c | 14.8482 ± 0.0018 Å |
| α | 83.332 ± 0.005° |
| β | 78.022 ± 0.005° |
| γ | 63.468 ± 0.004° |
| Cell volume | 1615.9 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.059 |
| Residual factor for significantly intense reflections | 0.0398 |
| Weighted residual factors for significantly intense reflections | 0.0937 |
| Weighted residual factors for all reflections included in the refinement | 0.1031 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4079570.html
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