Information card for entry 4079606

Structure parameters

• Formula: C34 H58 N6 O2 Si2
• Calculated formula: C34 H58 N6 O2 Si2
• SMILES: [Si]12(O[Si]3(O1)([N](=C(N3C(C)(C)C)c1ccccc1)C(C)(C)C)N(C)C)([N](=C(c1ccccc1)N2C(C)(C)C)C(C)(C)C)N(C)C
• Title of publication: Reactivity Studies of Heteroleptic Silylenes with N2O
• Authors of publication: Azhakar, Ramachandran; Pröpper, Kevin; Dittrich, Birger; Roesky, Herbert W.
• Journal of publication: Organometallics
• Year of publication: 2012
• Journal volume: 31
• Journal issue: 21
• Pages of publication: 7586
• a: 10.0862 ± 0.0002 Å
• b: 17.4581 ± 0.0004 Å
• c: 11.1872 ± 0.0003 Å
• α: 90°
• β: 111.728 ± 0.001°
• γ: 90°
• Cell volume: 1829.95 ± 0.08 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 4
• Hermann-Mauguin space group symbol: P 1 21 1
• Hall space group symbol: P 2yb
• Residual factor for all reflections: 0.0307
• Residual factor for significantly intense reflections: 0.0306
• Weighted residual factors for significantly intense reflections: 0.0843
• Weighted residual factors for all reflections included in the refinement: 0.0844
• Goodness-of-fit parameter for all reflections included in the refinement: 1.054
• Diffraction radiation wavelength: 1.54178 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No