Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4079892
Preview
Coordinates | 4079892.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | ClMeSi(ON[Me]O).2 C6H6 |
---|---|
Chemical name | 2,4,8,10-Tetra-tert-butyl-6-chloro-6,12-dimethyl-12H- dibenzo[d,g][1,3,6,2]dioxazasilocine bisbenzene solvate |
Formula | C42 H58 Cl N O2 Si |
Calculated formula | C42 H58 Cl N O2 Si |
SMILES | [Si]12([N](C)(c3c(O1)c(cc(c3)C(C)(C)C)C(C)(C)C)c1c(O2)c(cc(c1)C(C)(C)C)C(C)(C)C)(Cl)C.c1ccccc1.c1ccccc1 |
Title of publication | Migrations of Alkyl and Aryl Groups from Silicon to Nitrogen in Silylated Aryloxyiminoquinones |
Authors of publication | Shekar, Sukesh; Brown, Seth N. |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 2 |
Pages of publication | 556 |
a | 9.7339 ± 0.0006 Å |
b | 17.7599 ± 0.0011 Å |
c | 23.0354 ± 0.0014 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3982.2 ± 0.4 Å3 |
Cell temperature | 121 ± 2 K |
Ambient diffraction temperature | 121 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0799 |
Residual factor for significantly intense reflections | 0.0588 |
Weighted residual factors for significantly intense reflections | 0.1547 |
Weighted residual factors for all reflections included in the refinement | 0.1635 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.999 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4079892.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.