Information card for entry 4080033

Structure parameters

• Formula: C38 H34 Cl6 Cu Ga P2 Si
• Calculated formula: C38 H34 Cl6 Cu Ga P2 Si
• Title of publication: σ-SiH Complexes of Copper: Experimental Evidence and Computational Analysis
• Authors of publication: Joost, Maximilian; Mallet-Ladeira, Sonia; Miqueu, Karinne; Amgoune, Abderrahmane; Bourissou, Didier
• Journal of publication: Organometallics
• Year of publication: 2013
• Journal volume: 32
• Journal issue: 3
• Pages of publication: 898
• a: 10.467 ± 0.0004 Å
• b: 12.3178 ± 0.0004 Å
• c: 16.7001 ± 0.0006 Å
• α: 107.352 ± 0.002°
• β: 91.413 ± 0.002°
• γ: 99.282 ± 0.002°
• Cell volume: 2022.19 ± 0.13 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0475
• Residual factor for significantly intense reflections: 0.0342
• Weighted residual factors for significantly intense reflections: 0.0866
• Weighted residual factors for all reflections included in the refinement: 0.0937
• Goodness-of-fit parameter for all reflections included in the refinement: 1.026
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No