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Information card for entry 4080206
Preview
Coordinates | 4080206.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H63 I N3 O3 P2 Si2 Y |
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Calculated formula | C44 H63 I N3 O3 P2 Si2 Y |
SMILES | [Y]123(C(P(c4ccccc4)(c4ccccc4)=[N]1[Si](C)(C)C)(P(c1ccccc1)(c1ccccc1)=[N]2[Si](C)(C)C)C(=N\C(C)(C)C)\O3)(I)([O]1CCCC1)[O]1CCCC1 |
Title of publication | Reactivity Studies of a T-Shaped Yttrium Carbene: C‒F and C‒O Bond Activation and C═C Bond Formation Promoted by [Y(BIPM)(I)(THF)2] (BIPM = C(PPh2NSiMe3)2) |
Authors of publication | Mills, David P.; Lewis, William; Blake, Alexander J.; Liddle, Stephen T. |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 5 |
Pages of publication | 1239 |
a | 11.8331 ± 0.0013 Å |
b | 17.3545 ± 0.0018 Å |
c | 23.769 ± 0.002 Å |
α | 90° |
β | 102.276 ± 0.002° |
γ | 90° |
Cell volume | 4769.5 ± 0.8 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.06 |
Residual factor for significantly intense reflections | 0.0357 |
Weighted residual factors for significantly intense reflections | 0.0752 |
Weighted residual factors for all reflections included in the refinement | 0.0834 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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