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Information card for entry 4080208
Preview
Coordinates | 4080208.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C51 H73 I N3 O2 P2 Si2 Y |
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Calculated formula | C51 H73 I N3 O2 P2 Si2 Y |
SMILES | [Y]12(I)(C(=P(c3ccccc3)(c3ccccc3)N1[Si](C)(C)C)P(c1ccccc1)(c1ccccc1)=[N]2[Si](C)(C)C)([O]1CCCC1)Nc1c(cccc1C(C)C)C(C)C.O1CCCC1 |
Title of publication | Reactivity Studies of a T-Shaped Yttrium Carbene: C‒F and C‒O Bond Activation and C═C Bond Formation Promoted by [Y(BIPM)(I)(THF)2] (BIPM = C(PPh2NSiMe3)2) |
Authors of publication | Mills, David P.; Lewis, William; Blake, Alexander J.; Liddle, Stephen T. |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 5 |
Pages of publication | 1239 |
a | 12.2756 ± 0.0002 Å |
b | 45.6639 ± 0.0007 Å |
c | 9.47291 ± 0.00014 Å |
α | 90° |
β | 99.2161 ± 0.0015° |
γ | 90° |
Cell volume | 5241.51 ± 0.14 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0582 |
Residual factor for significantly intense reflections | 0.0483 |
Weighted residual factors for significantly intense reflections | 0.134 |
Weighted residual factors for all reflections included in the refinement | 0.137 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.23 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4080208.html
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