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Information card for entry 4080598
Preview
| Coordinates | 4080598.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45 H43 N O2 Si2 Sn |
|---|---|
| Calculated formula | C45 H43 N O2 Si2 Sn |
| SMILES | [Sn](O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)[N](Cc1ccccc1)(C)C |
| Title of publication | Unusual Reactivity of a C,N-Chelated Stannylene with Siloxanes and Silanols |
| Authors of publication | Padělková, Zdeňka; Švec, Petr; Kampová, Hana; Sýkora, Jan; Semler, Miloslav; Štěpnička, Petr; Bakardjieva, Snejana; Willem, Rudolph; Růžička, Aleš |
| Journal of publication | Organometallics |
| Year of publication | 2013 |
| Journal volume | 32 |
| Journal issue | 8 |
| Pages of publication | 2398 |
| a | 12.7452 ± 0.0012 Å |
| b | 13.6259 ± 0.0005 Å |
| c | 13.8621 ± 0.0012 Å |
| α | 113.392 ± 0.004° |
| β | 113.727 ± 0.006° |
| γ | 92.396 ± 0.005° |
| Cell volume | 1963.7 ± 0.3 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0615 |
| Residual factor for significantly intense reflections | 0.0405 |
| Weighted residual factors for significantly intense reflections | 0.075 |
| Weighted residual factors for all reflections included in the refinement | 0.0831 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.