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Information card for entry 4080799
Preview
Coordinates | 4080799.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H45 Cl2 N2 O P3 Ru Si |
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Calculated formula | C45 H45 Cl2 N2 O P3 Ru Si |
SMILES | [CH]1(=[P]2n3ccc[n]3[Ru]12(C#[O])([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1)[Si](C)(C)C.C(Cl)Cl |
Title of publication | Ambiphilic Reactivity of a Ruthenaphosphaalkenyl: Synthesis ofP-Pyrazolylphosphaalkene Complexes of Ruthenium(0) |
Authors of publication | Trathen, Nicola; Greenacre, Victoria K.; Crossley, Ian R.; Roe, S. Mark |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 9 |
Pages of publication | 2501 |
a | 10.8579 ± 0.0003 Å |
b | 19.3948 ± 0.0006 Å |
c | 20.9791 ± 0.0006 Å |
α | 84.03 ± 0.001° |
β | 84.873 ± 0.001° |
γ | 89.758 ± 0.001° |
Cell volume | 4376.3 ± 0.2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0844 |
Residual factor for significantly intense reflections | 0.0682 |
Weighted residual factors for significantly intense reflections | 0.1538 |
Weighted residual factors for all reflections included in the refinement | 0.1603 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.14 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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