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Information card for entry 4081089
Preview
Coordinates | 4081089.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H36 N2 |
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Calculated formula | C40 H36 N2 |
SMILES | c1cc2ccccc2c(/N=C(/C(=N/c2c3c(ccc2[C@H](c2ccccc2)C)cccc3)C)C)c1[C@H](C)c1ccccc1.c1cc2ccccc2c(/N=C(/C(=N/c2c3c(ccc2[C@@H](c2ccccc2)C)cccc3)C)C)c1[C@@H](C)c1ccccc1 |
Title of publication | Chiral Naphthyl-α-diimine Nickel(II) Catalysts Bearingsec-Phenethyl Groups: Chain-Walking Polymerization of Ethylene at High Temperature and Stereoselective Polymerization of Methyl Methacrylate at Low Temperature |
Authors of publication | Yuan, Jianchao; Wang, Fuzhou; Xu, Weibing; Mei, Tongjian; Li, Jing; Yuan, Bingnian; Song, Fengying; Jia, Zong |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 14 |
Pages of publication | 3960 |
a | 18.79 ± 0.03 Å |
b | 21.41 ± 0.03 Å |
c | 7.767 ± 0.01 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3125 ± 8 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 56 |
Hermann-Mauguin space group symbol | P c c n |
Hall space group symbol | -P 2ab 2ac |
Residual factor for all reflections | 0.1154 |
Residual factor for significantly intense reflections | 0.063 |
Weighted residual factors for significantly intense reflections | 0.1149 |
Weighted residual factors for all reflections included in the refinement | 0.1382 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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