Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4081285
Preview
Coordinates | 4081285.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H70 B2 F8 N6 P4 Pd |
---|---|
Calculated formula | C64 H70 B2 F8 N6 P4 Pd |
SMILES | [B](F)(F)(F)[F-].[B](F)(F)(F)[F-].c1(ccccc1)[P]12CN(Cc3ccccc3)C[P](c3ccccc3)(CN(Cc3ccccc3)C1)[Pd]12[P]2(c3ccccc3)CN(Cc3ccccc3)C[P]1(c1ccccc1)CN(Cc1ccccc1)C2.C(#N)C.C(#N)C |
Title of publication | Synthesis, Structural, and Electrocatalytic Reduction Studies of [Pd(P2N2)2]2+Complexes |
Authors of publication | Seu, Candace S.; Ung, David; Doud, Michael D.; Moore, Curtis E.; Rheingold, Arnold L.; Kubiak, Clifford P. |
Journal of publication | Organometallics |
Year of publication | 2013 |
Journal volume | 32 |
Journal issue | 16 |
Pages of publication | 4556 |
a | 10.5769 ± 0.0005 Å |
b | 24.516 ± 0.0008 Å |
c | 24.1638 ± 0.0009 Å |
α | 90° |
β | 99.188 ± 0.002° |
γ | 90° |
Cell volume | 6185.4 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0665 |
Residual factor for significantly intense reflections | 0.0418 |
Weighted residual factors for significantly intense reflections | 0.0717 |
Weighted residual factors for all reflections included in the refinement | 0.08 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4081285.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.