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Information card for entry 4082890
Preview
Coordinates | 4082890.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H56 O4 P2 Ru S |
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Calculated formula | C36 H56 O4 P2 Ru S |
SMILES | [Ru]1([P](C(C)C)(C(C)C)C(C)C)(/C=C/c2ccccc2)([P](C(C)C)(C(C)C)C(C)C)([O]=C(O1)c1ccc(SC(=O)C)cc1)C#[O] |
Title of publication | Divinylphenylene- and Ethynylvinylphenylene-Bridged Mono-, Di-, and Triruthenium Complexes for Covalent Binding to Gold Electrodes |
Authors of publication | Wuttke, Evelyn; Hervault, Yves-Marie; Polit, Walther; Linseis, Michael; Erler, Philipp; Rigaut, Stéphane; Winter, Rainer F. |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 18 |
Pages of publication | 4672 |
a | 10.687 ± 0.002 Å |
b | 11.378 ± 0.002 Å |
c | 15.979 ± 0.003 Å |
α | 102.68 ± 0.03° |
β | 94.23 ± 0.03° |
γ | 92.34 ± 0.03° |
Cell volume | 1887.2 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0663 |
Residual factor for significantly intense reflections | 0.0414 |
Weighted residual factors for significantly intense reflections | 0.077 |
Weighted residual factors for all reflections included in the refinement | 0.0829 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4082890.html
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