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Information card for entry 4083487
Preview
| Coordinates | 4083487.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C46 H55 Cl4 Cu N4 Zn |
|---|---|
| Calculated formula | C46 H55 Cl4 Cu N4 Zn |
| SMILES | [Zn]1([H][Cu]2N(C(=CC(=[N]2c2c(Cl)cccc2Cl)C)C)c2c(Cl)cccc2Cl)N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Weakly Coordinated Zinc and Aluminum σ-Complexes of Copper(I) |
| Authors of publication | Nako, Adi E.; Tan, Qian Wen; White, Andrew J. P.; Crimmin, Mark R. |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 11 |
| Pages of publication | 2685 |
| a | 12.7453 ± 0.0004 Å |
| b | 12.7844 ± 0.0004 Å |
| c | 14.8223 ± 0.0005 Å |
| α | 100.891 ± 0.003° |
| β | 97.037 ± 0.003° |
| γ | 101.712 ± 0.003° |
| Cell volume | 2289.55 ± 0.14 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0485 |
| Residual factor for significantly intense reflections | 0.0397 |
| Weighted residual factors for significantly intense reflections | 0.1055 |
| Weighted residual factors for all reflections included in the refinement | 0.1113 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.091 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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