Information card for entry 4083497

Structure parameters

• Chemical name: Bis{bis(di-tert-butylmethylsilyl)[(tetrahydrofuran)lithio]silyl}
• Formula: C44 H100 Li2 O2 Si6
• Calculated formula: C44 H100 Li2 O2 Si6
• SMILES: [Si]1([Si](C)(C(C)(C)C)C(C)(C)C)([Si](C)(C(C)(C)C)C(C)(C)C)[Li]([Si]([Si](C)(C(C)(C)C)C(C)(C)C)([Si](C)(C(C)(C)C)C(C)(C)C)[Li]1[O]1CCCC1)[O]1CCCC1
• Title of publication: Isolable Alkali-Metal-Substituted Silyl Radicals (tBu2MeSi)2SiM (M = Li, Na, K): Electronically and Sterically Accessible Planar Silyl Radicals
• Authors of publication: Inoue, Shigeyoshi; Ichinohe, Masaaki; Sekiguchi, Akira
• Journal of publication: Organometallics
• Year of publication: 2008
• Journal volume: 27
• Journal issue: 7
• Pages of publication: 1358
• a: 15.048 ± 0.0006 Å
• b: 16.03 ± 0.0014 Å
• c: 23.183 ± 0.0018 Å
• α: 90°
• β: 94.838 ± 0.004°
• γ: 90°
• Cell volume: 5572.3 ± 0.7 ų
• Cell temperature: 120 ± 0.1 K
• Ambient diffraction temperature: 120 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0889
• Residual factor for significantly intense reflections: 0.0514
• Weighted residual factors for significantly intense reflections: 0.1322
• Weighted residual factors for all reflections included in the refinement: 0.1538
• Goodness-of-fit parameter for all reflections included in the refinement: 0.956
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No