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Information card for entry 4083793
Preview
Coordinates | 4083793.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C27 H46 B2 Cl2 F8 Fe O0 P2 Se2 |
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Calculated formula | C27 H46 B2 Cl2 F8 Fe P2 Se2 |
SMILES | [Se]1[Se][P+]([c]23[Fe]456789%10([cH]2[cH]4[cH]5[cH]36)[c]2([P+]1(C(C)(C)C)C(C)(C)C)[cH]7[cH]8[cH]9[cH]%102)(C(C)(C)C)C(C)(C)C.ClCCl.[B](F)(F)(F)[F-].[B](F)(F)(F)[F-] |
Title of publication | Anodic Electrochemistry of Free and Coordinated 1,1‘-Bis(di-tert-butylphosphino)ferrocene |
Authors of publication | Blanco, Fawn N.; Hagopian, Laura E.; McNamara, William R.; Golen, James A.; Rheingold, Arnold L.; Nataro, Chip |
Journal of publication | Organometallics |
Year of publication | 2006 |
Journal volume | 25 |
Journal issue | 18 |
Pages of publication | 4292 |
a | 12.0758 ± 0.0013 Å |
b | 15.8867 ± 0.0017 Å |
c | 18.513 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3551.6 ± 0.7 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 9 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0406 |
Residual factor for significantly intense reflections | 0.0347 |
Weighted residual factors for significantly intense reflections | 0.0897 |
Weighted residual factors for all reflections included in the refinement | 0.0922 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4083793.html
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Users of the data should acknowledge the original authors of the
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