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Information card for entry 4083919
Preview
Coordinates | 4083919.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H51 F Hf2 N2 O |
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Calculated formula | C39 H51 F Hf2 N2 O |
SMILES | [cH]12[c]3([cH]4[c]5([c]1(C)[Hf]16789%102345([c]2([cH]8[c]7([cH]6[c]12C)C)C)OC=[N]9[Hf]12345678([c]9([cH]1[c]2([cH]3[c]49C)C)C)([c]1([cH]8[c]7([c]6([cH]51)C)C)C)N%10)C)C.c1ccccc1F |
Title of publication | N‒H and N‒C Bond Formation with an N2-Derived Dihafnium μ-Nitrido Complex |
Authors of publication | Semproni, Scott P.; Chirik, Paul J. |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 14 |
Pages of publication | 3727 |
a | 10.1858 ± 0.0012 Å |
b | 12.4686 ± 0.0014 Å |
c | 14.8013 ± 0.0016 Å |
α | 112.29 ± 0.003° |
β | 93.368 ± 0.003° |
γ | 92.903 ± 0.002° |
Cell volume | 1730.9 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0327 |
Residual factor for significantly intense reflections | 0.0259 |
Weighted residual factors for significantly intense reflections | 0.0762 |
Weighted residual factors for all reflections included in the refinement | 0.0988 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.161 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4083919.html
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Users of the data should acknowledge the original authors of the
structural data.