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Information card for entry 4084117
Preview
Coordinates | 4084117.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H64 P4 Tm |
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Calculated formula | C42 H64 P4 Tm |
SMILES | [p]12c(c3[p](cc(c(c3)C)C)[Tm]3456789%102(P2[C]3(=[C]4([C]5(=[C]62C(C)(C)C)C)C)C(C)(C)C)P2[C]7(C(C)(C)C)=[C]8([C]%10(C)=[C]92C(C)(C)C)C)cc(c(c1)C)C |
Title of publication | Multiple One-Electron Transfers in Bipyridine Complexes of Bis(phospholyl) Thulium |
Authors of publication | Jacquot, Léa; Xémard, Mathieu; Clavaguéra, Carine; Nocton, Grégory |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 15 |
Pages of publication | 4100 |
a | 18.1927 ± 0.0005 Å |
b | 11.5425 ± 0.0003 Å |
c | 20.4504 ± 0.0006 Å |
α | 90° |
β | 108.009 ± 0.002° |
γ | 90° |
Cell volume | 4084 ± 0.2 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.0875 |
Residual factor for significantly intense reflections | 0.0615 |
Weighted residual factors for significantly intense reflections | 0.1405 |
Weighted residual factors for all reflections included in the refinement | 0.1569 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.124 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4084117.html
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Users of the data should acknowledge the original authors of the
structural data.