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Information card for entry 4084202
Preview
Coordinates | 4084202.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H21 O9 P W |
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Calculated formula | C25 H21 O9 P W |
SMILES | [W](C#[O])(C#[O])(C#[O])(C#[O])(C#[O])[P@@]1(c2ccccc2)C=C(C)[C@@]2(C)C1=CCC(=C2C(=O)OC)C(=O)OC.[W](C#[O])(C#[O])(C#[O])(C#[O])(C#[O])[P@]1(c2ccccc2)C=C(C)[C@]2(C)C1=CCC(=C2C(=O)OC)C(=O)OC |
Title of publication | Modifying the Chemistry of the Phosphole Dienic System by α-Vinylation |
Authors of publication | Ng, Kim Hong; Li, Yongxin; Ganguly, Rakesh; Mathey, Francois |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 16 |
Pages of publication | 4245 |
a | 7.8997 ± 0.0002 Å |
b | 13.3814 ± 0.0004 Å |
c | 13.989 ± 0.0004 Å |
α | 66.3596 ± 0.0016° |
β | 89.6223 ± 0.0016° |
γ | 74.1012 ± 0.0016° |
Cell volume | 1293.87 ± 0.07 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0409 |
Residual factor for significantly intense reflections | 0.0295 |
Weighted residual factors for significantly intense reflections | 0.0596 |
Weighted residual factors for all reflections included in the refinement | 0.0636 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4084202.html
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Users of the data should acknowledge the original authors of the
structural data.