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Information card for entry 4084494
Preview
Coordinates | 4084494.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [η^6^-9,10-dimethoxy-4H-cyclopenta[def]triphenylene]- [η^5^-(hydroxymethyl)tetraamethylcyclopentadienyl]ruthenium(II) hexafluorophosphate |
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Formula | C34 H37 F6 O4 P Ru |
Calculated formula | C34 H37 F6 O4 P Ru |
SMILES | [Ru]123456789([cH]%10[cH]1[cH]2[c]13Cc2cccc3c%11cc(OC)c(OC)cc%11[c]4%10[c]51c23)[c]1([c]9([c]8([c]7([c]61C)CO)C)C)C.[P](F)(F)(F)(F)(F)[F-].O=C(C)C |
Title of publication | Site Selectivity of [RuCp*]+Complexation in Cyclopenta[def]triphenylenes |
Authors of publication | Hoggard, Bryce R.; Larsen, Christopher B.; Lucas, Nigel T. |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 21 |
Pages of publication | 6200 |
a | 9.8304 ± 0.0004 Å |
b | 11.139 ± 0.0004 Å |
c | 14.5873 ± 0.0005 Å |
α | 88.506 ± 0.003° |
β | 87.78 ± 0.003° |
γ | 73.274 ± 0.004° |
Cell volume | 1528.41 ± 0.1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0414 |
Residual factor for significantly intense reflections | 0.0386 |
Weighted residual factors for significantly intense reflections | 0.0984 |
Weighted residual factors for all reflections included in the refinement | 0.1015 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4084494.html
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Users of the data should acknowledge the original authors of the
structural data.