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Information card for entry 4084708
Preview
Coordinates | 4084708.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H82 O5 Si10 |
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Calculated formula | C33 H82 O5 Si10 |
SMILES | C1(CCC([Si]1(O)OC(=O)O[Si]1(C(CCC1([Si](C)(C)C)[Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)O)([Si](C)(C)C)[Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Reactions of an Isolable Dialkylsilylene with Carbon Dioxide and Related Heterocumulenes |
Authors of publication | Liu, Xupeng; Xiao, Xu-Qiong; Xu, Zheng; Yang, Xuemin; Li, Zhifang; Dong, Zhaowen; Yan, Chenting; Lai, Guoqiao; Kira, Mitsuo |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 19 |
Pages of publication | 5434 |
a | 26.507 ± 0.003 Å |
b | 15.3489 ± 0.0019 Å |
c | 12.3982 ± 0.0016 Å |
α | 90° |
β | 93.785 ± 0.003° |
γ | 90° |
Cell volume | 5033.2 ± 1.1 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0627 |
Residual factor for significantly intense reflections | 0.0472 |
Weighted residual factors for significantly intense reflections | 0.1352 |
Weighted residual factors for all reflections included in the refinement | 0.1567 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4084708.html
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