Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4084888
Preview
Coordinates | 4084888.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | octakis(tert-butyl)octasilsesquioxane |
---|---|
Formula | C32 H72 O12 Si8 |
Calculated formula | C32 H72 O12 Si8 |
SMILES | C(C)(C)(C)[Si]12O[Si]3(C(C)(C)C)O[Si]4(C(C)(C)C)O[Si](O2)(O[Si]2(C(C)(C)C)O[Si](C(C)(C)C)(O[Si](O3)(O[Si](O1)(C(C)(C)C)O2)C(C)(C)C)O4)C(C)(C)C |
Title of publication | Silanetriols as Powerful Starting Materials for Selective Condensation to Bulky POSS Cages. |
Authors of publication | Hurkes, Natascha; Bruhn, Clemens; Belaj, Ferdinand; Pietschnig, Rudolf |
Journal of publication | Organometallics |
Year of publication | 2014 |
Journal volume | 33 |
Journal issue | 24 |
Pages of publication | 7299 - 7306 |
a | 10.7426 ± 0.0014 Å |
b | 11.0102 ± 0.0013 Å |
c | 11.864 ± 0.0014 Å |
α | 111.291 ± 0.009° |
β | 72.229 ± 0.009° |
γ | 94.686 ± 0.01° |
Cell volume | 1244.4 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0534 |
Residual factor for significantly intense reflections | 0.0454 |
Weighted residual factors for significantly intense reflections | 0.1293 |
Weighted residual factors for all reflections included in the refinement | 0.1334 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4084888.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.