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Information card for entry 4084985
Preview
Coordinates | 4084985.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H58 B2 F8 N2 Ni P4 S2 |
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Calculated formula | C56 H58 B2 F8 N2 Ni P4 S2 |
SMILES | [B](F)(F)(F)[F-].c1(ccccc1)[P]1(c2ccccc2)N([P](c2ccccc2)(c2ccccc2)[Ni]21[P](c1ccccc1)(c1ccccc1)N([P]2(c1ccccc1)c1ccccc1)CCCSC)CCCSC.[B](F)(F)(F)[F-] |
Title of publication | Facile and Room-Temperature Activation of Csp3‒Cl Bonds by Cheap and Air-Stable Nickel(II) Complexes of (N-Thioether) DPPA-Type Ligands |
Authors of publication | Ghisolfi, Alessio; Condello, Francesca; Fliedel, Christophe; Rosa, Vitor; Braunstein, Pierre |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 11 |
Pages of publication | 2255 |
a | 17.537 ± 0.0006 Å |
b | 16.7133 ± 0.0005 Å |
c | 19.1594 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5615.6 ± 0.3 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 8 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0789 |
Residual factor for significantly intense reflections | 0.0433 |
Weighted residual factors for significantly intense reflections | 0.109 |
Weighted residual factors for all reflections included in the refinement | 0.1346 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.111 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4084985.html
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