Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4085120
Preview
Coordinates | 4085120.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H44 F2 Ir2 N4 S4 |
---|---|
Calculated formula | C64 H44 F2 Ir2 N4 S4 |
SMILES | c12ccccc1c1[n](c3c(s1)cccc3)[Ir]132([F][Ir]24(c5ccccc5c5[n]2c2c(s5)cccc2)([F]1)c1ccccc1c1[n]4c2c(s1)cccc2)c1ccccc1c1[n]3c2c(s1)cccc2.c1ccccc1.c1ccccc1 |
Title of publication | Fluoride Complexes of Cyclometalated Iridium(III) |
Authors of publication | Maity, Ayan; Stanek, Robert J.; Anderson, Bryce L.; Zeller, Matthias; Hunter, Allen D.; Moore, Curtis E.; Rheingold, Arnold L.; Gray, Thomas G. |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 1 |
Pages of publication | 109 |
a | 14.7816 ± 0.0005 Å |
b | 14.7816 ± 0.0005 Å |
c | 48.415 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 10578.5 ± 0.8 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 6 |
Space group number | 142 |
Hermann-Mauguin space group symbol | I 41/a c d :2 |
Hall space group symbol | -I 4bd 2c |
Residual factor for all reflections | 0.0718 |
Residual factor for significantly intense reflections | 0.0318 |
Weighted residual factors for significantly intense reflections | 0.0549 |
Weighted residual factors for all reflections included in the refinement | 0.0673 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085120.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.