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Information card for entry 4085355
Preview
Coordinates | 4085355.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Hf=Ge complex |
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Chemical name | Hf-germylene complex |
Formula | C35 H69 Ge Hf P Si2 |
Calculated formula | C35 H69 Ge Hf P Si2 |
SMILES | [Hf]12345678([Ge]([Si](C)(C(C)(C)C)C(C)(C)C)[Si](C)(C(C)(C)C)C(C)(C)C)([P](C)(C)C)([c]9([cH]1[cH]2[cH]3[cH]49)CC)[c]1([cH]8[cH]7[cH]6[cH]51)CC |
Title of publication | A Schrock-Type Germylene Complex: (η5-C5H4Et)2(PMe3)Hf═Ge(SiMetBu2)2 |
Authors of publication | Nakata, Norio; Aoki, Shinji; Lee, Vladimir Ya.; Sekiguchi, Akira |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 11 |
Pages of publication | 2699 |
a | 19.162 ± 0.0005 Å |
b | 11.805 ± 0.0005 Å |
c | 19.681 ± 0.0009 Å |
α | 90° |
β | 118.26 ± 0.003° |
γ | 90° |
Cell volume | 3921.3 ± 0.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.048 |
Residual factor for significantly intense reflections | 0.0451 |
Weighted residual factors for significantly intense reflections | 0.1201 |
Weighted residual factors for all reflections included in the refinement | 0.1259 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085355.html
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