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Information card for entry 4085429
Preview
Coordinates | 4085429.cif |
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Original paper (by DOI) | HTML |
Formula | C42 H73 N2 Na O4 Si |
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Calculated formula | C42 H73 N2 Na O4 Si |
SMILES | c1(c(cccc1C(C)C)C(C)C)N([Si](Nc1c(cccc1C(C)C)C(C)C)(C)C)[Na]([O]1CCCC1)([O]1CCCC1)[O]1CCCC1.O1CCCC1 |
Title of publication | Group 1 Complexes of an (Amido-amino)silane and Their Use in the Synthesis of the Bi(III) Amide, Bi(Me2Si{NAr}{N(H)Ar})Cl2(Ar = 2,6-i-Pr2C6H3) |
Authors of publication | Schwamm, Ryan J.; Coles, Martyn P.; Fitchett, Christopher M. |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 11 |
Pages of publication | 2500 |
a | 11.3893 ± 0.0004 Å |
b | 12.2039 ± 0.0004 Å |
c | 16.516 ± 0.0006 Å |
α | 80.126 ± 0.003° |
β | 74.202 ± 0.003° |
γ | 77.259 ± 0.003° |
Cell volume | 2139.28 ± 0.13 Å3 |
Cell temperature | 120.02 ± 0.1 K |
Ambient diffraction temperature | 120.02 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0589 |
Residual factor for significantly intense reflections | 0.0464 |
Weighted residual factors for significantly intense reflections | 0.1149 |
Weighted residual factors for all reflections included in the refinement | 0.1244 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085429.html
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