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Information card for entry 4085431
Preview
Coordinates | 4085431.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H41 Bi Cl2 N2 Si |
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Calculated formula | C26 H41 Bi Cl2 N2 Si |
SMILES | [Bi]1(Cl)(Cl)N(c2c(cccc2C(C)C)C(C)C)[Si]([NH]1c1c(cccc1C(C)C)C(C)C)(C)C |
Title of publication | Group 1 Complexes of an (Amido-amino)silane and Their Use in the Synthesis of the Bi(III) Amide, Bi(Me2Si{NAr}{N(H)Ar})Cl2(Ar = 2,6-i-Pr2C6H3) |
Authors of publication | Schwamm, Ryan J.; Coles, Martyn P.; Fitchett, Christopher M. |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 11 |
Pages of publication | 2500 |
a | 9.2487 ± 0.0003 Å |
b | 10.3251 ± 0.0003 Å |
c | 15.3742 ± 0.0004 Å |
α | 84.291 ± 0.002° |
β | 82.523 ± 0.002° |
γ | 88.256 ± 0.002° |
Cell volume | 1448.21 ± 0.07 Å3 |
Cell temperature | 278.87 ± 0.1 K |
Ambient diffraction temperature | 278.87 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0303 |
Residual factor for significantly intense reflections | 0.0282 |
Weighted residual factors for significantly intense reflections | 0.0646 |
Weighted residual factors for all reflections included in the refinement | 0.066 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085431.html
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Users of the data should acknowledge the original authors of the
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