Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4085731
Preview
Coordinates | 4085731.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H42 N O4 P Si |
---|---|
Calculated formula | C33 H42 N O4 P Si |
SMILES | P(=Nc1c(cccc1C(C)C)C(C)C)(/C(=C(\[Si](C)(C)C)C(=O)OC)C(=O)OC)(c1ccccc1)c1ccccc1 |
Title of publication | Fine Tuning of the Substituents on the N-Geminal Phosphorus/Silicon-Based Lewis Pairs for the Synthesis ofZ-Type Silyliminophosphoranylalkenes |
Authors of publication | Li, Jiancheng; Li, Yan; Purushothaman, Indu; De, Susmita; Li, Bin; Zhu, Hongping; Parameswaran, Pattiyil; Ye, Qingsong; Liu, Weiping |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 17 |
Pages of publication | 4209 |
a | 10.5684 ± 0.0006 Å |
b | 10.7627 ± 0.0006 Å |
c | 15.5029 ± 0.001 Å |
α | 81.274 ± 0.005° |
β | 85.745 ± 0.005° |
γ | 68.583 ± 0.005° |
Cell volume | 1622.26 ± 0.18 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0595 |
Residual factor for significantly intense reflections | 0.0459 |
Weighted residual factors for significantly intense reflections | 0.1013 |
Weighted residual factors for all reflections included in the refinement | 0.1074 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085731.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.