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Information card for entry 4085750
Preview
Coordinates | 4085750.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H64 B O2 P Ti |
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Calculated formula | C56 H64 B O2 P Ti |
SMILES | [B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[c]123[cH]4[cH]5[cH]6[cH]1[Ti]17893456([cH]3[cH]1[cH]7[cH]8[cH]93)(Oc1ccc(cc1)OC)[P](C2(C)C)(C1CCCCC1)C1CCCCC1 |
Title of publication | Synthetic Endeavors toward Titanium Based Frustrated Lewis Pairs with Controlled Electronic and Steric Properties |
Authors of publication | Normand, Adrien T.; Richard, Philippe; Balan, Cédric; Daniliuc, Constantin G.; Kehr, Gerald; Erker, Gerhard; Le Gendre, Pierre |
Journal of publication | Organometallics |
Year of publication | 2015 |
Pages of publication | 150513110717003 |
a | 9.9005 ± 0.0002 Å |
b | 14.8304 ± 0.0003 Å |
c | 31.2422 ± 0.0007 Å |
α | 90° |
β | 97.868 ± 0.001° |
γ | 90° |
Cell volume | 4544.06 ± 0.17 Å3 |
Cell temperature | 115 K |
Ambient diffraction temperature | 115 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0768 |
Residual factor for significantly intense reflections | 0.0503 |
Weighted residual factors for significantly intense reflections | 0.1178 |
Weighted residual factors for all reflections included in the refinement | 0.1308 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085750.html
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Users of the data should acknowledge the original authors of the
structural data.