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Information card for entry 4086472
Preview
Coordinates | 4086472.cif |
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Original paper (by DOI) | HTML |
Formula | C35 H51 O2 P Ru Si2 |
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Calculated formula | C35 H51 O2 P Ru Si2 |
SMILES | [Ru]12([P](C3CCCC3)(C3CCCC3)C3CCCC3)([Si](C)(C)c3cccc4c3[O]2c2c(C4(C)C)cccc2[Si]1(C)C)C#[O] |
Title of publication | Directedortho-C‒H Silylation Coupled withtrans-Selective Hydrogenation of Arylalkynes Catalyzed by Ruthenium Complexes of a Xanthene-BasedSi,O,Si-Chelate Ligand, “Xantsil” |
Authors of publication | Komuro, Takashi; Kitano, Takeo; Yamahira, Nobukazu; Ohta, Keisuke; Okawara, Satoshi; Mager, Nathalie; Okazaki, Masaaki; Tobita, Hiromi |
Journal of publication | Organometallics |
Year of publication | 2016 |
Journal volume | 35 |
Journal issue | 9 |
Pages of publication | 1209 |
a | 10.0512 ± 0.0007 Å |
b | 18.766 ± 0.0012 Å |
c | 19.7903 ± 0.0014 Å |
α | 106.247 ± 0.0019° |
β | 100.462 ± 0.0016° |
γ | 100.808 ± 0.002° |
Cell volume | 3410.1 ± 0.4 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.097 |
Residual factor for significantly intense reflections | 0.0746 |
Weighted residual factors for significantly intense reflections | 0.1598 |
Weighted residual factors for all reflections included in the refinement | 0.1747 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.213 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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