Information card for entry 4086507

Structure parameters

• Formula: C33 H51 Cl N4 Si2
• Calculated formula: C33 H51 Cl N4 Si2
• SMILES: Cl[Si](=Nc1c(cccc1C(C)C)C(C)C)(/N=C(/[Si](C)(C)C)c1ccccc1)=C1N(C(=C(N1C(C)C)C)C)C(C)C
• Title of publication: Selective Silylation of Nitriles with an NHC-Stabilized Silylene to 1,2-Disilylimines and Subsequent Synthesis of Silaaziridines
• Authors of publication: Li, Jianfeng; Ma, Bing; Cui, Chunming
• Journal of publication: Organometallics
• Year of publication: 2016
• Journal volume: 35
• Journal issue: 10
• Pages of publication: 1358
• a: 11.571 ± 0.004 Å
• b: 12.215 ± 0.004 Å
• c: 12.525 ± 0.004 Å
• α: 100.28 ± 0.013°
• β: 91.594 ± 0.005°
• γ: 101.848 ± 0.015°
• Cell volume: 1700.9 ± 1 ų
• Cell temperature: 113 ± 2 K
• Ambient diffraction temperature: 113 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0517
• Residual factor for significantly intense reflections: 0.0479
• Weighted residual factors for significantly intense reflections: 0.1148
• Weighted residual factors for all reflections included in the refinement: 0.1197
• Goodness-of-fit parameter for all reflections included in the refinement: 1.098
• Diffraction radiation wavelength: 1.54178 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No