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Information card for entry 4086749
Preview
Coordinates | 4086749.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C93 H96.5 Cl2 N2 Ni P |
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Calculated formula | C91 H94 Cl2 N2 Ni P |
SMILES | [Ni](Cl)(Cl)([P](C1CCCCC1)(C1CCCCC1)C1CCCCC1)=C1N(C=CN1c1c(cc(cc1C(c1ccccc1)c1ccccc1)C)C(c1ccccc1)c1ccccc1)c1c(cc(cc1C(c1ccccc1)c1ccccc1)C)C(c1ccccc1)c1ccccc1.c1(ccc(cc1)C)C |
Title of publication | Heteroleptic Nickel Complexes for the Markovnikov-Selective Hydroboration of Styrenes |
Authors of publication | Touney, Eric E.; Van Hoveln, Ryan; Buttke, Carl T.; Freidberg, Michael D.; Guzei, Ilia A.; Schomaker, Jennifer M. |
Journal of publication | Organometallics |
Year of publication | 2016 |
Journal volume | 35 |
Journal issue | 20 |
Pages of publication | 3436 |
a | 13.613 ± 0.004 Å |
b | 23.589 ± 0.007 Å |
c | 24.661 ± 0.007 Å |
α | 106.004 ± 0.016° |
β | 95.015 ± 0.018° |
γ | 96.289 ± 0.015° |
Cell volume | 7509 ± 4 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0796 |
Residual factor for significantly intense reflections | 0.0444 |
Weighted residual factors for significantly intense reflections | 0.0874 |
Weighted residual factors for all reflections included in the refinement | 0.1 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4086749.html
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