Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4086884
Preview
Coordinates | 4086884.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H84 Al3 Cr O12 |
---|---|
Calculated formula | C36 H84 Al3 Cr O12 |
SMILES | C(C)(C)[O]1[Al](OC(C)C)([O](C(C)C)[Cr]231([O](C(C)C)[Al]([O]3C(C)C)(OC(C)C)OC(C)C)[O](C(C)C)[Al]([O]2C(C)C)(OC(C)C)OC(C)C)OC(C)C |
Title of publication | X‒H Bond Activation on Cr(III),O Sites (X = R, H): Key Steps in Dehydrogenation and Hydrogenation Processes |
Authors of publication | Delley, Murielle F.; Silaghi, Marius-C.; Nuñez-Zarur, Francisco; Kovtunov, Kirill V.; Salnikov, Oleg G.; Estes, Deven P.; Koptyug, Igor V.; Comas-Vives, Aleix; Copéret, Christophe |
Journal of publication | Organometallics |
Year of publication | 2016 |
a | 12.3234 ± 0.001 Å |
b | 12.3234 ± 0.001 Å |
c | 31.719 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4817 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 96 |
Hermann-Mauguin space group symbol | P 43 21 2 |
Hall space group symbol | P 4nw 2abw |
Residual factor for all reflections | 0.0411 |
Residual factor for significantly intense reflections | 0.0386 |
Weighted residual factors for significantly intense reflections | 0.1257 |
Weighted residual factors for all reflections included in the refinement | 0.128 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.142 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4086884.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.