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Information card for entry 4087022
Preview
Coordinates | 4087022.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H72 B Cl2 F4 Ir N2 |
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Calculated formula | C56 H72 B Cl2 F4 Ir N2 |
SMILES | [Ir]123456(=C7N(CCN7[c]71[c]13c(ccc7C3CCCCC3)ccc([cH]21)C1CCCCC1)c1c(C2CCCCC2)ccc2ccc(C3CCCCC3)cc12)[CH]1=[CH]4CC[CH]5=[CH]6CC1.[B](F)(F)(F)[F-].ClCCl |
Title of publication | In-Depth Study on Chloride Abstractions from (NHC)Ir(COD)Cl Complexes |
Authors of publication | Sipos, Gellért; Gao, Pengchao; Foster, Daven; Skelton, Brian W.; Sobolev, Alexandre N.; Dorta, Reto |
Journal of publication | Organometallics |
Year of publication | 2017 |
Journal volume | 36 |
Journal issue | 4 |
Pages of publication | 801 |
a | 11.0781 ± 0.0001 Å |
b | 17.6947 ± 0.0002 Å |
c | 25.0413 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4908.69 ± 0.09 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0393 |
Residual factor for significantly intense reflections | 0.0341 |
Weighted residual factors for significantly intense reflections | 0.0642 |
Weighted residual factors for all reflections included in the refinement | 0.0667 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4087022.html
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Users of the data should acknowledge the original authors of the
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