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Information card for entry 4087098
Preview
Coordinates | 4087098.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H103 N O2 Si Ti |
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Calculated formula | C66 H103 N O2 Si Ti |
SMILES | [Ti]12345(OC6([C@@H](N1[Si](C)(C)C)c1ccccc1)CCC(CC6)C(C)(C)C)(OC1(CCC(CC1)C(C)(C)C)[C@H]1C(=CC=C1)C1C6CC7CC1CC(C6)C7)[c]1([cH]2[cH]3[cH]4[cH]51)C1C2CC3CC1CC(C2)C3.CCCCCC |
Title of publication | Reactions of Secondary Amines with Bis(η5:η1-pentafulvene)titanium Complexes: Formation of Titanium Amides and Titanaaziridines |
Authors of publication | Manßen, Manfred; Lauterbach, Nicolai; Woriescheck, Tim; Schmidtmann, Marc; Beckhaus, Rüdiger |
Journal of publication | Organometallics |
Year of publication | 2017 |
Journal volume | 36 |
Journal issue | 4 |
Pages of publication | 867 |
a | 11.8512 ± 0.001 Å |
b | 20.3693 ± 0.0018 Å |
c | 12.3394 ± 0.0011 Å |
α | 90° |
β | 101.05 ± 0.0018° |
γ | 90° |
Cell volume | 2923.5 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0395 |
Residual factor for significantly intense reflections | 0.0347 |
Weighted residual factors for significantly intense reflections | 0.0875 |
Weighted residual factors for all reflections included in the refinement | 0.0899 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4087098.html
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