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Information card for entry 4087640
Preview
Coordinates | 4087640.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H28 Fe2 N2 S |
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Calculated formula | C28 H28 Fe2 N2 S |
SMILES | C1N(C)c2c([c]34[cH]5[cH]6[cH]7[cH]3[Fe]389%104567[cH]4[cH]3[cH]8[cH]9[cH]%104)sc(c2N(C1)C)[c]12[cH]3[cH]4[cH]5[cH]1[Fe]16782345[cH]2[cH]1[cH]6[cH]7[cH]82 |
Title of publication | Ferrocenes Bridged by Ethylenediamino Thiophene: Varying Charge Transfer Properties in a Series of 3,4-Di-N-substituted 2,5-Diferrocenyl Thiophenes |
Authors of publication | Speck, J. Matthäus; Korb, Marcus; Schade, Alexander; Spange, Stefan; Lang, Heinrich |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 15 |
Pages of publication | 3788 |
a | 19.8701 ± 0.0005 Å |
b | 17.2782 ± 0.0005 Å |
c | 12.7919 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4391.7 ± 0.2 Å3 |
Cell temperature | 110.1 ± 0.14 K |
Ambient diffraction temperature | 110 ± 0.14 K |
Number of distinct elements | 5 |
Space group number | 43 |
Hermann-Mauguin space group symbol | F d d 2 |
Hall space group symbol | F 2 -2d |
Residual factor for all reflections | 0.0239 |
Residual factor for significantly intense reflections | 0.0224 |
Weighted residual factors for significantly intense reflections | 0.0494 |
Weighted residual factors for all reflections included in the refinement | 0.0498 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4087640.html
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Users of the data should acknowledge the original authors of the
structural data.