Information card for entry 4087938

Structure parameters

• Formula: C44 H82 Ag2 F6 N6 O6 S2 Si6
• Calculated formula: C44 H82 Ag2 F6 N6 O6 S2 Si6
• SMILES: [Ag]1([Si]2([N](=C(N2C(C)(C)C)c2ccccc2)C(C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)[O]([Ag]([Si]2([N](C(C)(C)C)=C(N2C(C)(C)C)c2ccccc2)N([Si](C)(C)C)[Si](C)(C)C)[O]1S(=O)(=O)C(F)(F)F)S(=O)(=O)C(F)(F)F
• Title of publication: Silicon(II) Bis(trimethylsilyl)amide (LSiN(SiMe3)2, L = PhC(NtBu)2) Supported Copper, Silver, and Gold Complexes
• Authors of publication: Khan, Shabana; Ahirwar, Saurabh K.; Pal, Shiv; Parvin, Nasrina; Kathewad, Neha
• Journal of publication: Organometallics
• Year of publication: 2015
• Journal volume: 34
• Journal issue: 22
• Pages of publication: 5401
• a: 9.455 ± 0.003 Å
• b: 39.412 ± 0.011 Å
• c: 17.344 ± 0.005 Å
• α: 90°
• β: 104.283 ± 0.007°
• γ: 90°
• Cell volume: 6263 ± 3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 8
• Space group number: 9
• Hermann-Mauguin space group symbol: C 1 c 1
• Hall space group symbol: C -2yc
• Residual factor for all reflections: 0.0443
• Residual factor for significantly intense reflections: 0.0407
• Weighted residual factors for significantly intense reflections: 0.1013
• Weighted residual factors for all reflections included in the refinement: 0.1043
• Goodness-of-fit parameter for all reflections included in the refinement: 1.047
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No