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Information card for entry 4088527
Preview
Coordinates | 4088527.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H76 F6 O6 P4 Rh2 S2 |
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Calculated formula | C52 H76 F6 O6 P4 Rh2 S2 |
SMILES | C12c3c(cccc3)[P](C(C)C)(C(C)C)[RhH]32([O]=S(O[RhH]24(C(c5c(cccc5)[P]2(C(C)C)C(C)C)c2c([P]4(C(C)C)C(C)C)cccc2)[O]=S(O3)(=O)C(F)(F)F)(C(F)(F)F)=O)[P](c2c1cccc2)(C(C)C)C(C)C |
Title of publication | Ligand Attachment Chemistry in the Preparation of PCsp3P and PCsp2P Complexes of Rhodium |
Authors of publication | Logan, Jessamyn R.; Piers, Warren E.; Borau-Garcia, Javier; Spasyuk, Denis M. |
Journal of publication | Organometallics |
Year of publication | 2016 |
Journal volume | 35 |
Journal issue | 9 |
Pages of publication | 1279 |
a | 12.3021 ± 0.0004 Å |
b | 12.5264 ± 0.0003 Å |
c | 26.0389 ± 0.0007 Å |
α | 90° |
β | 134.925 ± 0.001° |
γ | 90° |
Cell volume | 2841.06 ± 0.15 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0755 |
Residual factor for significantly intense reflections | 0.0548 |
Weighted residual factors for significantly intense reflections | 0.0986 |
Weighted residual factors for all reflections included in the refinement | 0.1073 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.109 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4088527.html
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Users of the data should acknowledge the original authors of the
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