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Information card for entry 4088580
Preview
Coordinates | 4088580.cif |
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Original paper (by DOI) | HTML |
Formula | C44 H71 Al N6 Si |
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Calculated formula | C44 H71 Al N6 Si |
Title of publication | Lewis Acid/Base Reactions of the Bis(amidinato)silylene [iPrNC(Ph)NiPr]2Si and Bis(guanidinato)silylene [iPrNC(NiPr2)NiPr]2Si with ElPh3(El = B, Al) |
Authors of publication | Mück, Felix M.; Baus, Johannes A.; Bertermann, Rüdiger; Burschka, Christian; Tacke, Reinhold |
Journal of publication | Organometallics |
Year of publication | 2016 |
Journal volume | 35 |
Journal issue | 16 |
Pages of publication | 2583 |
a | 11.635 ± 0.008 Å |
b | 23.239 ± 0.015 Å |
c | 16.351 ± 0.011 Å |
α | 90° |
β | 90.39 ± 0.02° |
γ | 90° |
Cell volume | 4421 ± 5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0482 |
Residual factor for significantly intense reflections | 0.0362 |
Weighted residual factors for significantly intense reflections | 0.0878 |
Weighted residual factors for all reflections included in the refinement | 0.0949 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4088580.html
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