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Information card for entry 4101805
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Coordinates | 4101805.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 3b |
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Formula | C28 H36 O4 S6 Si4 |
Calculated formula | C28 H36 O4 S6 Si4 |
SMILES | c12c3c([Si](C)(C)C)sc2c2c4c(c(s2)[Si](C)(C)C)S(=O)(=O)c2c4c(c4c1c(S3(=O)=O)c(s4)[Si](C)(C)C)sc2[Si](C)(C)C |
Title of publication | Cyclic Tetrathiophenes Planarized by Silicon and Sulfur Bridges Bearing Antiaromatic Cyclooctatetraene Core: Syntheses, Structures, and Properties |
Authors of publication | Takeshi Ohmae; Tohru Nishinaga; Mo Wu; Masahiko Iyoda |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 1066 - 1074 |
a | 6.4045 ± 0.0019 Å |
b | 10.484 ± 0.003 Å |
c | 26.798 ± 0.008 Å |
α | 90° |
β | 90.94 ± 0.005° |
γ | 90° |
Cell volume | 1799.1 ± 0.9 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0654 |
Residual factor for significantly intense reflections | 0.0482 |
Weighted residual factors for significantly intense reflections | 0.1122 |
Weighted residual factors for all reflections included in the refinement | 0.1289 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.193 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4101805.html
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