Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4102176
Preview
| Coordinates | 4102176.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H74 Ce I N4 O Si5 |
|---|---|
| Calculated formula | C34 H74 Ce I N4 O Si5 |
| SMILES | C1(=[N+](CCN1c1c(cccc1C(C)C)C(C)C)CC(C)(C)O[Ce]1(N([Si](C)(C)C)[Si]1(C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)I)[Si](C)(C)C |
| Title of publication | Addition-Elimination Reactions across the M-C Bond of Metal N-Heterocyclic Carbenes |
| Authors of publication | Zoë R. Turner; Ronan Bellabarba; Robert P. Tooze; Polly L. Arnold |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 4050 - 4051 |
| a | 9.7094 ± 0.0002 Å |
| b | 16.401 ± 0.0004 Å |
| c | 16.4221 ± 0.0004 Å |
| α | 106.65 ± 0.001° |
| β | 94.867 ± 0.001° |
| γ | 106.296 ± 0.001° |
| Cell volume | 2365.67 ± 0.1 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0403 |
| Residual factor for significantly intense reflections | 0.0341 |
| Weighted residual factors for significantly intense reflections | 0.0691 |
| Weighted residual factors for all reflections included in the refinement | 0.0727 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.142 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4102176.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.