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Information card for entry 4102178
Preview
| Coordinates | 4102178.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H74 I N4 O Si5 Y |
|---|---|
| Calculated formula | C34 H74 I N4 O Si5 Y |
| SMILES | I[Y](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)OC(C)(C)C[N+]1=C([Si](C)(C)C)N(CC1)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Addition-Elimination Reactions across the M-C Bond of Metal N-Heterocyclic Carbenes |
| Authors of publication | Zoë R. Turner; Ronan Bellabarba; Robert P. Tooze; Polly L. Arnold |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 4050 - 4051 |
| a | 9.6227 ± 0.0008 Å |
| b | 16.3315 ± 0.0013 Å |
| c | 16.4128 ± 0.0014 Å |
| α | 106.924 ± 0.004° |
| β | 94.311 ± 0.004° |
| γ | 106.275 ± 0.004° |
| Cell volume | 2334 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0395 |
| Residual factor for significantly intense reflections | 0.0296 |
| Weighted residual factors for significantly intense reflections | 0.069 |
| Weighted residual factors for all reflections included in the refinement | 0.073 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4102178.html
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