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Information card for entry 4102561
Preview
| Coordinates | 4102561.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H29 N3 O3 S2 |
|---|---|
| Calculated formula | C36 H29 N3 O3 S2 |
| Title of publication | Organic n-Channel Field-Effect Transistors Based on Arylenediimide-Thiophene Derivatives |
| Authors of publication | Rocío Ponce Ortiz; Helena Herrera; Raúl Blanco; Hui Huang; Antonio Facchetti; Tobin J. Marks; Yan Zheng; José L. Segura |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 8440 - 8452 |
| a | 40.194 ± 0.002 Å |
| b | 7.0805 ± 0.0004 Å |
| c | 26.8602 ± 0.0014 Å |
| α | 90° |
| β | 130.586 ± 0.004° |
| γ | 90° |
| Cell volume | 5805.3 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0924 |
| Residual factor for significantly intense reflections | 0.054 |
| Weighted residual factors for significantly intense reflections | 0.1238 |
| Weighted residual factors for all reflections included in the refinement | 0.142 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4102561.html
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Users of the data should acknowledge the original authors of the
structural data.