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Information card for entry 4102695
Preview
Coordinates | 4102695.cif |
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Original paper (by DOI) | HTML |
Formula | C67 H58 O15 Si10 |
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Calculated formula | C67 H58 O15 Si10 |
Title of publication | Nano Building Blocks via Iodination of [PhSiO1.5]n, Forming [p-I-C6H4SiO1.5]n (n = 8, 10, 12), and a New Route to High-Surface-Area, Thermally Stable, Microporous Materials via Thermal Elimination of I2 |
Authors of publication | M. F. Roll; J. W. Kampf; Y. Kim; E. Yi; R. M. Laine |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 10171 - 10183 |
a | 12.5377 ± 0.0009 Å |
b | 24.6836 ± 0.0017 Å |
c | 35.061 ± 0.002 Å |
α | 72.706 ± 0.0001° |
β | 80.434 ± 0.0001° |
γ | 81.395 ± 0.0001° |
Cell volume | 10157.9 ± 1.2 Å3 |
Cell temperature | 85 ± 2 K |
Ambient diffraction temperature | 85 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0561 |
Residual factor for significantly intense reflections | 0.0411 |
Weighted residual factors for significantly intense reflections | 0.1001 |
Weighted residual factors for all reflections included in the refinement | 0.1094 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4102695.html
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