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Information card for entry 4102790
Preview
Coordinates | 4102790.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H72 Cl2 P2 Pt2 |
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Calculated formula | C54 H72 Cl2 P2 Pt2 |
SMILES | [Pt]12([Cl][Pt]3([Cl]1)[P](Cc1c3cccc1)(C13CC4CC(CC(C1)C4)C3)C13CC4CC(CC(C1)C4)C3)[P](Cc1c2cccc1)(C12CC3CC(CC(C1)C3)C2)C12CC3CC(CC(C1)C3)C2 |
Title of publication | Reagent-Dependent Formation of C-C and C-F Bonds in Pt Complexes: An Unexpected Twist in the Electrophilic Fluorination Chemistry |
Authors of publication | Ariela W. Kaspi; Israel Goldberg; Arkadi Vigalok |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 10626 - 10627 |
a | 36.0527 ± 0.0004 Å |
b | 36.0527 ± 0.0004 Å |
c | 20.744 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 26963 ± 0.7 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 5 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.0657 |
Residual factor for significantly intense reflections | 0.0409 |
Weighted residual factors for significantly intense reflections | 0.0963 |
Weighted residual factors for all reflections included in the refinement | 0.1014 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.936 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4102790.html
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