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Information card for entry 4102792
Preview
Coordinates | 4102792.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H76 F P3 Pt |
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Calculated formula | C72 H76 F P3 Pt |
SMILES | [Pt]1([P](Cc2c1cccc2)(C12CC3CC(C1)CC(C2)C3)C12CC3CC(C2)CC(C1)C3)([P](c1ccccc1)(c1ccccc1)c1ccccc1)c1c(cc(cc1CF)C)C.P(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Reagent-Dependent Formation of C-C and C-F Bonds in Pt Complexes: An Unexpected Twist in the Electrophilic Fluorination Chemistry |
Authors of publication | Ariela W. Kaspi; Israel Goldberg; Arkadi Vigalok |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 10626 - 10627 |
a | 11.34 ± 0.0002 Å |
b | 15.621 ± 0.0003 Å |
c | 18.5266 ± 0.0005 Å |
α | 66.7454 ± 0.0011° |
β | 80.2447 ± 0.001° |
γ | 73.5493 ± 0.0013° |
Cell volume | 2885.6 ± 0.11 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0771 |
Residual factor for significantly intense reflections | 0.0594 |
Weighted residual factors for significantly intense reflections | 0.1007 |
Weighted residual factors for all reflections included in the refinement | 0.1068 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4102792.html
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