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Information card for entry 4103531
Preview
| Coordinates | 4103531.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Bis(ethylenedithio)tetrathiafulvalene tetrakis(trifluoromethyl)argentate(III) 1,1,2-trichloroethane |
|---|---|
| Formula | C26 H19 Ag Cl3 F12 S16 |
| Calculated formula | C26 H19 Ag Cl3 F12 S16 |
| Title of publication | Enhanced Critical Temperature in a Dual-Layered Molecular Superconductor |
| Authors of publication | John A. Schlueter; Leonore Wiehl; Hyunsoo Park; Mariano de Souza; Michael Lang; Hyun-Joo Koo; Myung-Hwan Whangbo |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2010 |
| Journal volume | 132 |
| Pages of publication | 16308 - 16310 |
| a | 8.4136 ± 0.0006 Å |
| b | 13.2172 ± 0.0007 Å |
| c | 37.7991 ± 0.0016 Å |
| α | 90.22 ± 0.004° |
| β | 91.244 ± 0.005° |
| γ | 90.444 ± 0.005° |
| Cell volume | 4202.3 ± 0.4 Å3 |
| Cell temperature | 110 ± 2 K |
| Ambient diffraction temperature | 110 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0786 |
| Residual factor for significantly intense reflections | 0.0645 |
| Weighted residual factors for significantly intense reflections | 0.1272 |
| Weighted residual factors for all reflections included in the refinement | 0.1335 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.095 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4103531.html
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Users of the data should acknowledge the original authors of the
structural data.