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Information card for entry 4103591
Preview
Coordinates | 4103591.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 1,1,4,4-Tetrakis[bis(trimethylsilyl)methyl]- 1-(2,2-dimethylpropyl)-4-isopropyl-2-tetrasilyne |
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Formula | C36 H94 Si12 |
Calculated formula | C36 H94 Si12 |
SMILES | [Si](#[Si]\[Si](C([Si](C)(C)C)[Si](C)(C)C)(C([Si](C)(C)C)[Si](C)(C)C)CC(C)(C)C)/[Si](C([Si](C)(C)C)[Si](C)(C)C)(C([Si](C)(C)C)[Si](C)(C)C)C(C)C |
Title of publication | Unsymmetrically Substituted Disilyne Dsi2iPrSi-Si\τbSi-SiNpDsi2 (Np = CH2tBu): Synthesis and Characterization |
Authors of publication | Yoshitaka Murata; Masaaki Ichinohe; Akira Sekiguchi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2010 |
Journal volume | 132 |
Pages of publication | 16768 - 16770 |
a | 10.9153 ± 0.0018 Å |
b | 16.404 ± 0.003 Å |
c | 18.292 ± 0.003 Å |
α | 105.255 ± 0.002° |
β | 104.71 ± 0.002° |
γ | 109.116 ± 0.002° |
Cell volume | 2770 ± 0.8 Å3 |
Cell temperature | 150 ± 0.1 K |
Ambient diffraction temperature | 150 ± 0.1 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0931 |
Residual factor for significantly intense reflections | 0.0508 |
Weighted residual factors for significantly intense reflections | 0.1212 |
Weighted residual factors for all reflections included in the refinement | 0.1376 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4103591.html
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Users of the data should acknowledge the original authors of the
structural data.