Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4103950
Preview
Coordinates | 4103950.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C49 H60 La O P S2 |
---|---|
Calculated formula | C49 H60 La O P S2 |
SMILES | [La]123456789([O]=P(c%10ccccc%10)(c%10ccccc%10)c%10ccccc%10)(SC(=[S]1)C1(C(=C(C(=C1C)C)C)C)C)([c]1([c]5([c]4([c]3([c]21C)C)C)C)C)[c]1([c]6([c]7([c]8([c]91C)C)C)C)C |
Title of publication | Reactivity of (C5Me5)3LaLx Complexes: Synthesis of a Tris(pentamethylcyclopentadienyl) Complex with Two Additional Ligands, (C5Me5)3La(NCCMe3)2 |
Authors of publication | William J. Evans; Thomas J. Mueller; Joseph W. Ziller |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 2678 - 2686 |
a | 12.0956 ± 0.0019 Å |
b | 12.0752 ± 0.0019 Å |
c | 31.142 ± 0.005 Å |
α | 90° |
β | 91.606 ± 0.002° |
γ | 90° |
Cell volume | 4546.7 ± 1.2 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0684 |
Residual factor for significantly intense reflections | 0.0503 |
Weighted residual factors for significantly intense reflections | 0.1167 |
Weighted residual factors for all reflections included in the refinement | 0.1243 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4103950.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.